Full Automatic High Speed Wafer Prober
Description of the Opto System Wafer Prober WPF8000
The Wafer ProberWPF8000 is able to handle wafers up to 8″ size. This prober electrically characterizes all the chips by contacting them from the top with probing needles. If both contacts are on the top the chips can remain on their tape while the high performance vision system with multiple cameras precisely align and monitor the measurement. If one contact is on the bottom, the chips are transferred to a gold plate serving as an electrode chuck. We can integrate your testing equipment or we would suggest one. The robust and reliable aspect of this tool has made it very successful among semiconductor manufacturing customers around the world. A current very large application case is the testing of BAW and SAW filters.