Flexible Set-Up For Automatic VCSEL Characterization Either On Wafer Or Packaged
Description of the Opto System VCSEL wafer package Tester VMSF3000
The VMSF3000 picks up either a tray with packaged devices or a wafer from a dedicated supply table. The state-of-the-art machine vision system perfectly aligns the VCSEL devices or packages with the probing needles and all individual VCSELs are tested to deliver their PI curve including its far field beam angular distribution, the polarization, the spectrum and of course the electric characteristics. All the data is generated in a file that allows you to study the statistics of your production and developments. The measurements are performed at a controlled temperature and a pre-heating stage is available too; especially for high-temperature measurements of the devices. All this is done in a machine in which all components are tailor made to seamlessly fulfill all the functions in full automatic fashion like a clockwork.