The fully automatic tester is specifically designed to test edge-emitting laser diode bars. Each emitter on the bar can measured for spectrum, I/V, I/P and far field beam pattern on a dedicated stage with controlled temperature. This tester provides precise high throughput characterization.
The full automatic chip tester is specifically designed to test edge-emitting laser diodes. The machine provides full characterization of spectrum, I/V and I/P at one controlled temperature.